Digital Sampling Oscilloscope
The Ultimate in Signal Fidelity for Challenging High-Speed Characterization Tests
With an industry-leading intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155Mb/sec to 100G.
Features & Benefits |
Highest Fidelity Signal Capture
- Very Low Time-base Jitter
- 425 fs on up to 8 Simultaneously Acquired Channels
- <100 fs on up to 6 Channels with 82A04B Phase Reference Module
- Industry’s Highest Vertical Resolution – 16 bit A/D
- Electrical Resolution: <20 µV LSB (for 1 V full range)
- Optical Resolution depends on the Dynamic Range of the Optical Module – Ranges from <20 nW for the 80C07B (1 mW full range) to <0.6 µW for the 80C10C (30 mW full range)
Flexible Configurations
- With Today’s Sampling Module Portfolio, the DSA8300 supports up to 8 Simultaneously Acquired Signals
- A Wide Variety of Optical, Electrical, and Accessory Modules to support your Specific Testing Requirements
- Optical Modules
- Fully Integrated Optical Modules that support all Standard Optical Data Rates from 155 Mb/s to 100 Gb/s
- Certified Optical Reference Receivers Support Specified Requirements for Standards-mandated Compliance Testing
- Optical Bandwidths to >80 GHz
- High Optical Sensitivity, Low Noise, and Wide Dynamic Range of the Optical Sampling Modules allows Accurate Testing and Characterization of Short-reach to Long-haul Optical Communications Standards
- Fully Calibrated Clock Recovery Solutions – No need to manually calibrate for data pick-off losses
- Calibrated Extinction Ratio Measurements ensure Repeatability of Extinction Ratio Measurements to <0.5 dB among Systems with Modules with this Factory Calibration Option
- Electrical Modules
- Electrical Bandwidths to >70 GHz
- Very Low-noise Electrical Samplers (280 µV at 20 GHz, 450 µV at 60 GHz, typical)
- Selectable Bandwidths*1 allow the User to Trade-off Sampler Bandwidth and Noise for Optimal Data Acquisition Performance
- Remote Samplers*2 or Compact Sampling Extender Module Cables support Minimal Signal Degradation by allowing the Sampler to be Located in Close Proximity to the Device Under Test
- World’s Highest-performance Integrated TDR (10 ps typical step rise time) supports Exceptional Impedance Discontinuity Characterization and High Dynamic Range for S-parameter Measurements to 50 GHz
Analysis
- Standard Analysis Capabilities
- Complete Suite of over 120 Automated Measurements for NRZ, RZ, and Pulse Signal Types
- Automated Mask Testing with over 80 Industry-standard Masks. New Masks can be Imported into the DSA8300 to support New Emerging Standards. Users can Define their own Masks for Automated Mask Testing
- Vertical and Horizontal Histograms for Waveform Statistical Analysis
- Vertical, Horizontal, and Waveform Cursors (with measurements)
- Jitter, Noise, BER, and Serial Data Link Analysis is provided through the 80SJNB Basic and Advanced Software Application Options
- Advanced TDR Analysis, S-parameter Measurements, Simulation Model Extraction, and Serial Link Simulation Capabilities are provided through the IConnect® Software Application Options
- High Test Throughput
- High Sample Acquisition Rate up to 300 kS/s per channel
- Efficient Programmatic Interface (IEEE-488, Ethernet, or local processor access) enable High Test Throughput
*1 With 80E07B, 80E08B, 80E09B, 80E10B, 80E11, and 80E11X1 modules.
*2 80E07B, 80E08B, 80E09B and and 80E10B, only.
Applications
- Design/Verification of Telecom and Datacom Components and Systems
- Manufacturing/Testing for ITU/ANSI/IEEE/SONET/SDH Compliance
- High-performance True-differential TDR Measurements
- Impedance Characterization and Network Analysis for Serial Data Applications including S-parameters
- Advanced Jitter, Noise, and BER Analysis
- Channel and Eye Diagram Simulation and Measurement-based SPICE Modeling
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Module Selection |
Module |
Description |
80A02 |
EOS/ESD Protection Module for electrical static isolation of Tektronix Electrical Sampling Modules; Statement of Compliance included with this product |
80A03 |
TekConnect Probe Interface Module |
80A05 |
Electrical Clock Recovery Module |
80C07B |
Optical Sampling Module; 2.488 GB/s OC48/STM16, 2.500 GB/s 2GBE, 2.500 GB/s INFINIBAND; 2.5 GHz Optical Bandwidth |
80C08D |
Single channel optical sampling module; 10G Optical Reference Receiver Filters; 12 GHz optical bandwidth; single-/multi-mode |
80C10C |
Single Channel, 65/80 GHz Optical Sampling Module(must specify one of options F1, F2, or F3) |
80C11B |
Single channel optical sampling module; 10G Optical Reference Receiver Filters; 28 GHz optical bandwidth; single-mode |
80C12B |
12 GHz, Broad WaveLength, Amplified Optical Sampling Module |
80C14 |
14+ GHz, Broad WaveLength, Amplified Optical Sampling Module |
80E01 |
50GHz; 1 Channel, Electrical Sampling Module - Certificate of Traceable Calibration Standard |
80E03 |
Sampling Module; Dual,20 GHz Electrical Sampling Module - Certificate of Traceable Calibration Standard |
80E04 |
Sampling Module; Dual,20 GHz w/TDR Electrical Sampling Module - Certificate of Traceable Calibration Standard |
80E07B |
8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module (includes D1) |
80E08B |
8000 Series, Dual Channel, 30 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) |
80E09B |
8000 Series, Dual Channel, 60 GHz, Remote Electrical Sampling Module (includes D1) |
80E10B |
8000 Series, Dual Channel, 50 GHz, Remote Electrical Sampling Module w/ TDR (includes D1) |
80E11 |
8000 Series, Dual Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) |
80E11X1 |
8000 Series, Single Channel, 70 GHz, Ultra-low Jitter, Electrical Sampling Module (includes D1) |
80N01 |
2 Meter Electrical Module Extender Cable (Not for 80E07-10) |
82A04B |
8000 Series, Phase Reference Module (includes D1) |
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Application Software |
Software |
Description |
80SICMX |
IConnect and MeasureXTractor Signal Integrity and Failure Analysis Software |
80SICON |
IConnect Signal Integrity and Failure Analysis Software |
80SJNB, 80SJARB |
Jitter, Noise, and BER Analysis Software |
80SSPAR |
IConnect S-Parameters and Z-Line Software |
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