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Increasing device complexity and technology convergence are driving test systems to become more flexible, while cost pressures are demanding longer system lifetimes. A software-defined, modular architecture is the only way to accomplish these objectives. Modular instrumentation uses shared components, high-speed buses, and open, user-defined software to meet the needs of automated test equipment (ATE) today and in the future.

Series CPU Speed Memory Bandwidth/Throughput  
Performance Up to 2.3 GHz Up to 16 GB Up to 8 GB/s system More detail
Remote Controller - - Up to 5.6 GB/s unidirection More detail
Integrated Chassis - - Up to 110 MB/s More detail