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2601B-PULSE

 

2601B-PULSE  SYSTEM SOURCEMETER® 

The System SourceMeter® 10 µsec Pulser/Source Measure Unit (SMU) Instrument combines the power of a high current/high speed pulser with measure and the full functionality of a traditional SMU in a single instrument. Its impressive 10 A @ 10 V at 10 μs pulse width and full 1 MS/s digitizing capabilities significantly boost productivity in applications ranging from benchtop characterization through highly automated pulsed I-V production test.
Applications

Laser Diode (VCSEL) Production Test for ToF/LIDAR Applications

The ideal solution for laser diode vertical cavity surface emitting laser (VCSEL) LIV production testing, the 2601B-PULSE features a high speed and high accuracy 10 μs Pulser and SMU for both current pulse sourcing and voltage-current monitoring of VCSELs, VCSEL arrays, and laser diode modules. SMUs provide the most cost-effective LIV instrumentation with high system synchronization and throughput.

  • - Programmable pulse current source up to 10 A and 10 µs pulse widths
  • - Voltage and current measure resolution at 100 nV and 100 fA
  • - Built-in TSP® processing capability reduces PC-instrument bus communication
Simplified Pulsed/DC I/V Characterization of LEDs

The 2601B-PULSE's unique current pulsing, DC voltage, and current capabilities enable high speed LED DC and Pulsed IV characterization and production test with 0.015% basic measure accuracy. Pulse testing a microLED, LED, or high brightness LED (HBLED) minimizes self-heating and reduces the negative impact on measurement accuracy, as well as eliminates the worries about damaging the device under test.

  • - Programmable current source up to 10 A and 10 µs pulse widths
  • - Voltage and current measure resolution at 100 nV and 100 fA
  • - 1 Megasample/second digitizers for fast source and measure data collection
  • - Built-in TSP processing capability reduces PC-instrument bus communication
On Wafer Semiconductor Testing

Keithleys 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of rack-and-stack instruments with the integration and high throughput of mainframe-based systems, using TSP and TSP-Link technologies to reduce manufacturing footprint and cost of test. These instruments are routinely used in on-wafer semiconductor testing of laser diodes, LEDs, transistors, and so much more.

  • - Built-in TSP processing capability reduces PC-instrument bus communication
  • - TSP-Link up to 32 instruments at 500 ns synchronization with other Keithley TSP instruments
 
Quick Selector Guide
 
 Model  Information
2601B-PULSE   1 chennels, 10 A Max Current, 40 V Max Voltage, 100 fA / 100 nV Measurement Resolution (Current / Voltage), 
Power Pulser: 100 W instantaneous SMU: 200 W instantaneous