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Increasing device complexity and technology convergence are driving test systems to become more flexible, while cost pressures are demanding longer system lifetimes. A software-defined, modular architecture is the only way to accomplish these objectives. Modular instrumentation uses shared components, high-speed buses, and open, user-defined software to meet the needs of automated test equipment (ATE) today and in the future.
| Key Features |
| Model |
Peripheral Slots |
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| NI PXIe-1071 |
4 : 1 Controller, 3 Hybrid slots |
More detail |
| NI PXIe-1082 |
8 : 4 Hybrid slots, 3 PXI Express slots, 1 PXI Express system timing slot |
More detail |
| NI PXIe-1078 |
9 : 1 Controller, 5 hybrid slots, 3 PXI Express slots |
More detail |
| NI PXIe-1085 |
18 : 1 Controller, 16 Hybird slots, 1 PXI Express system timing slot |
More detail |
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