The System SourceMeter® 10 µsec Pulser/Source Measure Unit (SMU) Instrument combines the power of a high current/high speed pulser with measure and the full functionality of a traditional SMU in a single instrument. Its impressive 10 A @ 10 V at 10 μs pulse width and full 1 MS/s digitizing capabilities significantly boost productivity in applications ranging from benchtop characterization through highly automated pulsed I-V production test.
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Laser Diode (VCSEL) Production Test for ToF/LIDAR ApplicationsThe ideal solution for laser diode vertical cavity surface emitting laser (VCSEL) LIV production testing, the 2601B-PULSE features a high speed and high accuracy 10 μs Pulser and SMU for both current pulse sourcing and voltage-current monitoring of VCSELs, VCSEL arrays, and laser diode modules. SMUs provide the most cost-effective LIV instrumentation with high system synchronization and throughput.
Simplified Pulsed/DC I/V Characterization of LEDs
The 2601B-PULSE's unique current pulsing, DC voltage, and current capabilities enable high speed LED DC and Pulsed IV characterization and production test with 0.015% basic measure accuracy. Pulse testing a microLED, LED, or high brightness LED (HBLED) minimizes self-heating and reduces the negative impact on measurement accuracy, as well as eliminates the worries about damaging the device under test.
On Wafer Semiconductor Testing
Keithley’s 2601B-PULSE and other Series 2600B System SourceMeter® SMU instruments combine the scalability and flexibility of rack-and-stack instruments with the integration and high throughput of mainframe-based systems, using TSP and TSP-Link technologies to reduce manufacturing footprint and cost of test. These instruments are routinely used in on-wafer semiconductor testing of laser diodes, LEDs, transistors, and so much more.
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