Keithley 2600-PCT-xB Parametric Curve Tracer Configurations

Developing and using MOSFETS, IGBTs, diodes and other high-power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. While I-V curve tracer software supports testing two-terminal devices on graphical SMUs, Keithley also offers high-power Parametric Curve Tracer configurations to support the full spectrum of device types and test parameters. These configurations more closely mimic the old Tektronix I-V curve tracers.

Model	Description	High Voltage Mode	High Current Mode
2600-PCT-1B	Low Power	200 V/10 A	200 V/10 A
2600-PCT-2B	High Current	200 V/10 A	40 V/50 A
2600-PCT-4B	High Current and High Voltage	3 kV/120 mA	40 V/50 A
2600-PCT-3B	High Voltage	3 kV/120 mA	200 V/10 A

Key Features

Complete solutions engineered for optimum price and performance
Field upgradable and reconfigurable – convert your PCT to a reliability or wafer sort tester
Configurable power levels:
- From 200 V to 3 kV
- From 1 A to 100 A
Wide dynamic range:
- From µV to kV
- From fA to 100 A
Full range of capacitance-voltage (C-V) capability :
- From fF to µF
- Supports 2, 3, and 4 terminal devices
- Up to 3 kV DC bias
High performance test fixture supports a range of package types
Probe station interface supports most probe types including HV triax, SHV coax, standard triax, and others

Applications

Power semiconductor device characterization and testing
Characterization of GaN and SiC, LDMOS and other devices
Reliability studies on power devices
Incoming inspection and device qualification

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