Model

Channel Output Frequency Record Length Sample Rate

Vertical Resolution

AFG31021 1 25 MHz 16 MSa/ch 250 MS/s 14-bit
AFG31022 2 25 MHz 16 MSa/ch 250 MS/s 14-bit
AFG31051 1 50 MHz 16 MSa/ch 500 MS/s 14-bit
AFG31052 2 50 MHz 16 MSa/ch 500 MS/s 14-bit
AFG31101 1 100 MHz 16 MSa/ch 1 GS/s 14-bit
AFG31102 2 100 MHz 16 MSa/ch 1 GS/s 14-bit
AFG31151 1 150 MHz 16 MSa/ch 2 GS/s 14-bit
AFG31152 2 150 MHz 16 MSa/ch 2 GS/s 14-bit
AFG31251 1 250 MHz 16 MSa/ch 2 GS/s 14-bit
AFG31252 2 250 MHz 16 MSa/ch 2 GS/s 14-bit

 

Key performance specifications
  • 1 or 2 channel models
  • Output amplitude range 1 mVP-P to 10`VP-P into 50`Ω loads
  • Basic (AFG) mode:
    • 25 MHz, 50 MHz, 100 MHz, 150 MHz, or 250 MHz sine waveforms
    • 250 MSa/s, 1 GSa/s or 2 GSa/s sample rates
    • 14-bit vertical resolution
    • Built-in waveforms include sine, square, ramp, pulse, noise, and other frequently used waveforms
    • Sweep, Burst, and Modulation modes (AM, FM, PM, FSK, and PWM)
  • Advanced (Sequence) mode:
    • Continuous mode (optional Sequence, Triggered and Gated modes)
    • 16 Mpts arbitrary waveform memory on each channel (128 Mpts optional)
    • Up to 256 steps in sequence mode with loop, jump and wait events
    • Variable sampling clock 1 μSa/s to 2 GSa/s

 

Key Features
  • Patented InstaView™ technology enables engineers to see the actual waveform at the Device Under Test (DUT) in real time, without the need of an oscilloscope and probe, eliminating the uncertainty caused by mismatched impedance
  • Sequencing option adds the ability to program long, complex waveforms with up to 256 steps
  • The 9-inch capacitive touch screen works like a smart phone and has short-cuts to frequently used settings
  • Built-in ArbBuilder lets you create and edit arbitrary waveforms on the instrument, eliminating the need to connect to a PC
  • Outputs are protected from over voltage and current to minimize potential instrument damage
  • Built-in Double Pulse Test application to generate voltage pulses with varying pulse widths onto the DUTs

 

Applications
  • Advanced research
  • Clock and system synchronization
  • Replication of real world signals
  • Component and circuit characterization and validation
  • Embedded circuit design and test
  • General purpose signal generation
  • Double pulse test

 

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