Key performance specifications
  • 4 GHz (TDP4000), 3.5 GHz (TDP3500) and 1.5 GHz (TDP1500) probe bandwidth
  • ≤1 pF (TDP1500) and ≤0.3 pF (TDP3500/TDP4000) differential input capacitance
  • 200 kΩ (TDP1500) and 100 kΩ (TDP3500/TDP4000) differential input resistance
  • ±25 V (TDP1500) and ±15 V (TDP3500/TDP4000) DC + pk AC input voltage (non-destruct)
  • >60 dB at 1 MHz and >25 dB at 1 GHz CMRR

 

Key Features 
  • Outstanding electrical performance
    • 4 GHz, 3.5 GHz and 1.5 GHz bandwidth models – accurate measurements for serial and digital applications
    • Excellent common mode rejection – reduces measurement errors in higher common environments
    • Low capacitive and resistive loading – maintains signal fidelity and reduces DC biasing interactions
  • Versatile mechanical performance
    • Compact probe head size for probing small geometry circuit elements
    • DUT attachment accessories enable connection to fine-spaced SMDs
    • Robust design for reliability
  • Easy to use
    • Connects directly to oscilloscopes with the TekVPI™ probe interface
    • Provides automatic units scaling and readout on the oscilloscopes display
    • Easy access to probe comp box controls or oscilloscope probe menu display for probe status, setup control, and diagnostic information
    • Integrated Scope/Probe system
    • Direct connection to and powered from the TekVPI™ oscilloscope interface (Connects directly to TekVPI scopes without the need of an external power supply, like many competitors require)
    • Single-button oscilloscope probe menu access
    • Setup and control from probe comp box or oscilloscope user interface
    • AutoZero – zeros out output offset
    • Remote GPIB/USB probe control through the oscilloscope

 

Applications
  • Design, validation, debugging, and characterization of common high-speed serial bus designs:
  • I2C
  • CAN/LIN
  • SPI
  • Serial ATA
  • Ethernet (GbE)
  • USB 2.0
  • FIreWire (1394b)
  • Signal integrity, jitter, and timing analysis
  • Manufacturing, engineering, and test

 

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