ðïļ AI Data Center Testing Applications
ð Battery Energy Storage Systems (BESS) Testing
Battery Energy Storage Systems are becoming a critical element in AI data centers, where extreme power density, fast load transients, and 800 V DC architectures demand highly responsive and reliable backup and stabilization solutions. Unlike traditional UPS systems, modern BESS must handle rapid ramp rates, bidirectional power flow, and seamless interaction with HVDC distribution and renewable energy sources.
Tektronix offers testing solutions ensuring precise analysis of dynamic charge/discharge behavior under AI workload profiles, ensuring thermal stability at high power levels, verifying protection mechanisms, and confirming long-term reliability and safety.
⥠Solid State Transformers (SST) Testing
Solid State Transformers (SSTs) are emerging as a key enabler of next-generation AI data center power architectures, supporting 800 V DC distribution, bidirectional power flow, and tighter integration with renewable and energy storage systems. Unlike conventional transformers, SSTs rely on high-frequency switching devices and advanced power electronics, introducing new validation challenges in efficiency, thermal performance, electromagnetic interference, and fast transient response.
Solutions by Tektronix help testing engineers verifying dynamic behavior under rapid load changes typical of AI compute clusters, assess control-loop stability, and validate protection mechanisms at high voltage and high power levels.
ðĄ Power Components Testing
Components such as high current connectors play a critical role in AI data center power distribution, where HV DC infrastructures and escalating rack power levels demand compact, low-loss, and highly reliable interconnect solutions. As current densities increase, connectors must withstand elevated thermal stress, resistive losses, and repeated mating cycles without degradation.
Tektronix solutions allow you to validate current-carrying capacity under dynamic load conditions, assessing temperature rise and contact resistance, and ensuring safe operation during fault scenarios such as short circuits or hot-plug events.
â Semiconductor Device Testing
Semiconductor materials such as SiC and GaN present particular challenges in R&D departments. Please see our solution site on semiconductor characterization.
Recommended Equipment for AI Data Center Power Architecture Testing ð
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