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Tektronix TriMode P7725 25 GHz Probe for High-Speed Signal Integrity Analysis

The Tektronix TriMode™ P7725 is a 25 GHz probe designed for high-speed signal integrity analysis, validation, and debugging of next-generation memory and high-speed I/O (HSIO) interfaces. Compatible with the Tektronix 7 Series DPO oscilloscope, it supports Differential, Single-Ended, and Common-Mode measurements in a single probe setup.

With improved waveform fidelity and reduced ringing, overshoot, and jitter, the P7725 supports applications including DDR5, DDR6, LPDDR5/5X, LPDDR6, HDMI, DisplayPort™, and MIPI. Compatible accessories include the P77STFLXA24 Active Solder-In Tip (up to 24 GHz) and P77C292MM SMA Adapter (up to 25 GHz).

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Key Features and Benefits
  • 25 GHz Bandwidth: Extends measurement capabilities for advanced high-speed I/O interfaces and next-generation memory technologies.
  • Three Measurement Modes in One Probe: Supports Differential, Single-Ended, and Common-Mode measurements without requiring a change in probe configuration.
  • Improved Signal Edge Response: Provides faster measured edges, improved rise times, and a cleaner step response.
  • Reduced Ringing and Overshoot: Helps improve waveform fidelity for more reliable signal analysis.
  • Enhanced Eye Diagram Performance: Offers lower jitter and improved visibility into signal timing margins.
  • High–Impedance Probing: Minimizes circuit loading to help preserve signal integrity during measurement.
  • Flexible Probing Accessories: Supports the P77STFLXA24 Active Solder-In Tip and P77C292MM SMA Adapter for different signal access requirements.
  • Advanced Analysis Capabilities: Can be used with supported signal integrity modeling and jitter analysis software to investigate high-speed signal behavior.

 

Applications
  1. DDR and LPDDR Memory Validation

    Designed to support signal validation and debugging for advanced memory technologies, including DDR5, DDR6, LPDDR5, LPDDR5X, and LPDDR6.

  2. High–Speed I/O Validation and Debugging

    Suitable for investigating signal behavior in high-speed I/O interfaces that require high measurement bandwidth and accurate waveform characterization.

  3. HDMI and DisplayPort Signal Analysis

    Supports high-speed signal measurement workflows for display interfaces. The appropriate probing accessory should be selected according to the signal access method and test configuration.

  4. MIPI Interface Analysis

    Supports high-speed signal validation and debugging for MIPI applications, including configurations requiring direct signal access or coaxial connections.

  5. Signal Integrity Analysis

    Helps engineers investigate ringing, overshoot, jitter, and other signal characteristics that may affect high-speed circuit performance.

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