Tektronix Low Voltage Probes: Single-Ended

A low voltage single-ended probe is typically used for measuring high-speed, ground referenced signals up to 12 V. These low voltage probes are the best choice for making measurements on high impedance, high frequency circuit elements which require minimal probe loading.  Users should select probes with a low input capacitance specification (~1 pF) to minimize the probe’s loading effect on the circuit.  A probe with lower input capacitance will offer higher input impedance at higher frequencies.

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Model Attenuation Bandwidth Input Impedance Maximum Voltage
TAP3500 10X 3.5 GHz 40 kΩ || ≤ 0.8 pF ± 4 V
TAP4000 10X 4 GHz 40 kΩ || ≤ 0.8 pF ± 4 V
TAP2500 10X 2.5 GHz 40 kΩ || ≤ 0.8 pF ± 4 V
TAP1500 10X 1.5 GHz 1 MΩ || ≤ 1 pF ± 8 V
P7240 5X 4 GHz 20 kΩ || ≤ 0.8 pF ± 2 V
P6243 10X 1 GHz 1 MΩ || ≤ 1 pF ± 8 V
P6245 10X 1.5 GHz 1 MΩ || ≤ 1 pF ± 8 V

 

Active Probes
The TAP2500, TAP3500 and TAP4000 Single-ended Active FET probes provide excellent high-speed electrical and mechanical performance required for today’s digital system designs.

Key Features

  • Outstanding electrical performance
  • High probe bandwidth
  • Fast probe rise time
  • Excellent signal fidelity
  • ≤0.8 pF input capacitance
  • 40 kΩ input resistance
  • -4 V to +4 V input dynamic range
  • -10 V to +10 VDC input offset range
  • ±30 V (DC + peak AC) Maximum input voltage (nondestructive)
  • Versatile mechanical performance
  • Small compact probe head for probing small geometry circuit elements
  • DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
  • Robust design for reliability
  • Easy to use
    • Connects directly to oscilloscopes with the TekVPI™ probe interface
    • Provides automatic units scaling and readout on the oscilloscope display
    • Easy access to oscilloscope probe menu display for probe status/diagnostic information and to control probe DC offset
    • Remote GPIB/USB probe control through the oscilloscope
  • Applications
    • Verification, debug, and characterization of high-speed designs
    • Signal integrity, jitter, and timing analysis
    • Manufacturing engineering and test
    • Signals with voltage swings up to 8 Vp-p

 

1.5 GHz Active Probe
TAP1500 Single-ended Active FET Probe provides excellent high-speed electrical and mechanical performance required for today’s digital system designs.

Key features

  • Outstanding electrical performance
  • ≥1.5 GHz probe bandwidth
  • <267 ps rise time
  • ≤1 pF input capacitance
  • 1 MΩ input resistance
  • -8 V to +8 V input dynamic range
  • -10 V to +10 VDC input offset range
  • Versatile mechanical performance
  • Small compact probe head for probing small geometry circuit elements
  • DUT attachment accessories enable connection to SMDs as small as 0.5 mm pitch
  • Robust design for reliability
  • Easy to use
  • Connects directly to oscilloscopes with the TekVPI™ probe interface
  • Provides automatic units scaling and readout on the oscilloscope display
  • Easy access to oscilloscope probe menu display for probe status/diagnostic information, and to control probe DC offset
  • Remote GPIB/USB probe control through the oscilloscope
  • Applications
  • High-speed Digital Systems Design
  • Component Design and Characterization
  • Manufacturing Engineering and Test
  • Educational Research
  • Signals with Voltage Swings up to 16 V

 

Active Probe for SMDs

Features & Benefits

P6245

  • ≥1.5 GHz Bandwidth (Typical, Probe Only)
  • ≤1 pF Input Capacitance
  • 1 MΩ Input Resistance
  • Direct Access to SMDs as Small as 0.5 mm Pitch
  • Measures CMOS, BiCMOS, ECL, GaAs, and TTL Logic

P6243

  • 1 GHz Bandwidth (probe only)
  • ≤1 pF Input Capacitance
  • 1 MΩ Input Resistance
  • Direct Access to SMDs as Small as 0.5 mm Pitch
  • Measures CMOS, BiCMOS, ECL, GaAs, and TTL Logic
  • Low-mass Probe Head/Cable
  • No Additional Power Supplies or Cables Are Required with TEKPROBE™ BNC Interface

Applications

  • High-speed Digital Systems Design
  • Component Design/Characterization
  • Manufacturing Engineering and Test
  • Educational Research

 

4 GHz Active Probe
The P7240 4 GHz, 5X active FET probe provides truer signal reproduction and fidelity for high-frequency measurements. The probe has low input capacitance and high input resistance to minimize circuit loading over a wide bandwidth range.

Features and benefits

  • <120 ps Rise Time (Guaranteed)
  • 4 GHz Bandwidth
  • <1 pF input capacitance
  • Small form factor probe head
  • Direct access to SMDs
  • Supports MSO/DPO/DSA70000 series oscilloscopes
  • TekConnect™ Interface

Applications

  • High-speed digital systems design
  • Component design/characterization
  • Signal integrity, jitter, and timing analysis
  • Mechanical engineering and test
  • Measures 3.0 V logic, InfiniBand, PCI Express, DDR, Rambus Data Lines, Gigabit Ethernet

 

 

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