The Semiconductor Characterization Challenge
Engineers and researchers are constantly challenged to create new semiconductor technologies or processes or improve existing ones. Whether the challenge is designing a lower power front end for a next–generation smartphone or investigating new materials for high efficiency solar panels, you need test tools and techniques that support making precise electrical measurements with high accuracy and efficiency.
This e-guide answers some common questions about making better semiconductor measurements, with a focus on DC I-V and capacitance-voltage (C-V) measurements. It also touches on more specific applications and how you can simplify making the measurements your most challenging applications require.