As test requirements continue to evolve, engineers need flexible platforms that can scale with new devices, higher voltages, and increasing channel counts. That’s why we’re excited to introduce the MSMU200-2 Source Measure Unit (SMU) Module for the MP5000 Modular Precision Test System.

Designed for semiconductor validation, production test, reliability testing, and optoelectronics characterization, the new module delivers:

• Up to 200 V and 1.5 A per channel
• 7 A extended pulsing capability for demanding device characterization
• Two SMU channels per module with up to six channels in a 1U MP5000 mainframe
• 1 MSa/s digitizing to capture fast transient events
• Precision measurements down to 100 fA
• Enhanced protection, contact checking, and remote sensing capabilities

The MSMU200-2 expands the MP5000 ecosystem, giving engineers greater flexibility to configure, scale, and future-proof their automated test systems while maximizing rack-space efficiency.

Whether you’re characterizing LEDs, semiconductor chip validation for ASICS & FPGAs, laser diodes, discrete components, or advanced semiconductor devices, the MP5000 platform now provides even more voltage range and pulsing performance to support your most challenging applications.

Learn more about the MP5000 MSMU200-2 and discover how modular precision testing can help you accelerate validation and production workflows.