New | Application Note
Dear Valued Customer,
Long-term data collection is essential for semiconductor test applications like breakdown tests. However, it often generates vast amounts of data—sometimes hundreds of thousands of data points over several days. Ideally, only a small fraction of data — such as points near a breakdown, is truly critical.
The Data Compression feature of the 4200A-SCS Parameter Analyzer offers an effective solution to this challenge. This feature enables users to compress less significant information while selectively retaining critical data points from areas of interest. By defining specific compression rules, users can reduce the volume of data returned, optimize test efficiency, and avoid exceeding software limits — all while ensuring their focus remains on meaningful results.
Download our latest application note today to explore how this powerful tool can transform your testing process with step-by-step guidance and practical examples!