As semiconductor designs grow denser and more complex—with the rapid expansion of AI, electrification, and high-speed devices—test teams are turning to parallel testing to keep pace with production and validation demands. Running multiple devices or channels simultaneously can dramatically increase throughput and reduce cost per test, but it also brings new challenges.

Synchronizing timing across channels, managing signal integrity, balancing instrumentation resources, and coordinating triggers between devices all require a high degree of control and flexibility. Traditional fixed trigger models often limit how efficiently true parallelism can be achieved.

Join us for a on-demand webinar, join Tektronix Lead Application Engineer, Elizabeth Makley, as she delves into how the MP5000 Series Modular Precision Test System is designed to overcome these limitations. With up to six parallel channels and a flexible trigger flow model, the MP5000 lets you design custom, scalable, and synchronized test setups that adapt to your application. Discover how you can achieve higher throughput, tighter control, and smarter test performance—all within a single, modular platform.