High speed I-V pulsing and measuring is often required for some semiconductor applications such as power device testing or to reduce the effects of self-heating caused by DC measurements.

The Segment Arb function enables users to stress test devices with AC signals during reliability cycling and generate multilevel waveform mode to program/erase memory devices.

Download this application note to learn more about the Segment Arb waveform feature of the 4225-PMU and how to use the built-in library tests for high speed, time-controlled pulsed applications.