Model Description High Voltage Mode High Current Mode
2600-PCT-1B Low Power 200 V/10 A 200 V/10 A
2600-PCT-2B High Current 200 V/10 A 40 V/50 A
2600-PCT-4B High Current and High Voltage 3 kV/120 mA 40 V/50 A
2600-PCT-3B High Voltage 3 kV/120 mA 200 V/10 A

 

Key Features
  • Complete solutions engineered for optimum price and performance
  • Field upgradable and reconfigurable – convert your PCT to a reliability or wafer sort tester
  • Configurable power levels:
    • From 200 V to 3 kV
    • From 1 A to 100 A
  • Wide dynamic range:
    • From µV to kV
    • From fA to 100 A
  • Full range of capacitance-voltage (C-V) capability :
    • From fF to µF
    • Supports 2, 3, and 4 terminal devices
    • Up to 3 kV DC bias
  • High performance test fixture supports a range of package types
  • Probe station interface supports most probe types including HV triax, SHV coax, standard triax, and others

 

Applications
  • Power semiconductor device characterization and testing
  • Characterization of GaN and SiC, LDMOS and other devices
  • Reliability studies on power devices
  • Incoming inspection and device qualification

 

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