Model Channels Max Current Source/Measure Range Max Voltage Source/Measure Range Measurement Resolution (Current / Voltage) Power
2634B 2 10A 200V 1fA / 100nV 200 W
2636B 2 10A 200V 0.1fA / 100nV 200 W
2635B 1 10A 200V 0.1fA / 100nV 200 W
2604B 2 10A 40V 100fA / 100nV 200 W
2601B 1 10A 40V 100fA / 100nV 200 W
2602B 2 10A 40V 100fA / 100nV 200 W
2611B 1 10A 200V 100fA / 100nV 200 W
2612B 2 10A 200V 100fA / 100nV 200 W
2614B 2 10A 200V 100fA / 100nV 200 W

 

Key Features
  • Tightly integrated, 4-quadrant voltage/current source and measure instruments offer best in class performance with 6½-digit resolution
  • Family of models offer industry’s widest dynamic range: 10 A pulse to 0.1 fA and 200 V to 100 nV
  • Built-in web browser based software enables remote control through any browser, on any computer, from anywhere in the world
  • Compatibility with the Keithley IVy mobile app enables true plug & play I/V characterization and test through any Android device
  • TSP (Test Script Processing) technology embeds complete test programs inside the instrument for best in class system-level throughput
  • TSP-Link expansion technology for multi-channel parallel test without a mainframe
  • Software emulation for Keithley’s 2400 SourceMeter SMU Instrument
  • USB 2.0, LXI-C, GPIB, RS-232, and digital I/O interfaces
  • Free software drivers and development/debug tools
  • Optional ACS-Basic semiconductor component characterization software

 

Typical Applications
     I-V functional test and characterization of a wide range of devices, including:

  • Discrete and passive components
    • Two-leaded – Sensors, disk drive heads, metal oxide varistors (MOVs), diodes, zener diodes, sensors, capacitors, thermistors
    • Three-leaded – Small signal bipolar junction transistors (BJTs), field-effect transistors (FETs), and more
  • Simple ICs – Optos, drivers, switches, sensors, converters, regulators
  • Integrated devices – small scale integrated (SSI) and large scale integrated (LSI)
    •  Analog ICs
    •  Radio frequency integrated circuits (RFICs)
    •  Application specific integrated circuits (ASICs)
    •  System on a chip (SOC) devices
  • Optoelectronic devices such as light emitting diodes (LEDs), laser diodes, high brightness LEDs (HBLEDs), vertical cavity surface-emitting lasers (VCSELs), displays
  • Wafer level reliability
    •  NBTI, TDDB, HCI, electromigration
  • Solar Cells
  • Batteries
  • And more…

 

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