Key Features
  • Source or sink up to 180 W of DC or pulsed power (±3000 V @ 20 mA, ±1500 V @ 120 mA).
  • 1 fA low current resolution.
  • Dual 22-bit precision ADCs and dual 18-bit 1 μs per point digitizers for high accuracy and high speed transient capture.
  • Fully TSP® compliant for easy system integration with Series 2600B System SourceMeter models.
  • Combines a precision power supply, current source, DMM, arbitrary waveform generator, V or I pulse generator, electronic 18-bit load, and trigger controller
    •  all in one instrument.
  • Includes TSP® Express characterization software, LabVIEW® driver, and Keithley’s Test Script Builder software development environment.

 

Typical Applications
  • Power semiconductor device characterization and testing
  • Characterization of GaN, SiC, and other compound materials and devices
  • Breakdown and leakage testing to 3 kV
  • Characterization of sub-millisecond transients

 

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