Model Current Range Voltage Resistance Charge Source
6430 10aA – 100mA 1µV – 200V 1µΩ – >20TΩ 0 – ±200V

0 – ±100mA

6514 100aA – 20mA 10µV – 200V 10mΩ – 200GΩ 10fC – 20μC
6517B 10aA – 20mA 10µV – 200V 100Ω – 10PΩ 10fC – 2μC 0 – ±1000V

 

6430 Sub-femtoamp Remote SourceMeter® SMU Instrument

The Model 6430 Sub-Femtoamp Remote SourceMeter SMU Instrument combines the voltage and current sourcing and measurement functions of Keithley’s popular SourceMeter SMU instruments with sensitivity, noise, and input resistance specifications superior to electrometers. This unique combination of broad functionality and exceptional measurement integrity is made possible by the Model 6430’s Remote PreAmp, which offers a very sensitive bi-directional amplifier with sensitive feedback elements for measuring or sourcing currents at the device being tested. The high level signals output by the Remote PreAmp are sent to the controlling mainframe via a two-meter cable. This allows the user to make a direct or very short connection to the signal, minimizing the effects of cable noise.

Key Feature

  • 0.4fA p-p (4E–16A) noise (typical)
  • Remote PreAmp can be located at the signal source to minimize cable noise
  • >1016W input resistance on voltage measurements
  • High speed — up to 2000 readings/second
  • Up to 6½-digit resolution
  • Fast characterization of components with programmable digital I/O and interfaces

 

Applications

The Model 6430’s capabilities make it equally useful for research work and for evaluating sophisticated components in test labs for lowcurrent, high-resistance, or sensitive semiconductor measurements. The low noise and drift performance of the Model 6430 also makes it well suited for research studies in single electron devices, highly resistive nanowires and nanotubes, polymers, highly resistive nanomaterials, and electrochemical amperometry applications.

 

6514 Programmable Electrometer
The Model 6514 Electrometer combines flexible interfacing capabilities with current sensitivity, charge measurement capabilities, resolution, and speed that are equal or superior to our earlier electrometers. The Model 6514’s built-in IEEE-488, RS-232, and digital I/O interfaces make it simple to configure fully automated, high speed systems for low-level testing.

The 5½-digit Model 6514 is designed for applications that demand fast, yet precise measurements of low currents, voltages from high resistance sources, charges, or high resistances.

Key features

  • <1fA noise
  • >200TW input impedance on voltage measurements
  • Charge measurements from 10fC to 20µC
  • High speed—up to 1200 readings/second
  • Interfaces readily with switches, computers, and component handlers
  • Cancels voltage and current offsets easily

 

Applications

  • High resistivity measurements
  • Leakage currents
  • Ion selective electrode measurements
  • pH measurements
  • Conductivity cells
  • Potentiometry

 

6517B Electrometer/High Resistance Meter

The Keithley 6517B Electrometer/High Resistance Meter is the worldwide research laboratory standard for sensitive measurements. With over 60 years of low level measurement expertise, Keithley electrometers provide reliable measurements of current levels down to 10 aA (10×10–18 A), charge levels down to 1 fC, and the highest resistance measurements available up to 1018 Ω. The 6517B is also capable of measuring the largest voltage range—up to 200 V—with an input impedance exceeding 200 TΩ. All this performance is built into an instrument that operates as simply as a digital multimeter.

Key features

  • Measures resistances up to 1018 Ω
  • 10aA (10×10–18 A) current measurement resolution
  • Complete hardware-software solution for ASTM D257 high resistivity measurements with the 6517B, 8009 Resistivity Test Fixture, and the KickStart High Resistivity Application
  • <3 fA input bias current
  • 6½-digit high accuracy measurement mode
  • <20 µV burden voltage on the lowest current ranges
  • Voltage measurements up to 200 V with >200 TΩ input impedance
  • Built-in ±1000 V voltage source
  • Unique alternating polarity voltage sourcing and measurement method for high resistance measurements
  • Built-in test sequences for four different device characterization tests, surface and volume resistivity, surface insulation resistance, and voltage sweeping
  • Optional plug-in scanner cards for testing up to ten devices or material samples with one test setup
  • GPIB and RS-232 interfaces

 

Applications

  • Nanomaterial characterization
  • Polymer electrical characterization
  • Beam measurements
  • Dosimetry
  • Device leakage current measurements
  • Insulation resistance measurements
  • Optoelectronic detector characterization
  • Volume and surface resistivity

 

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