Key Features
PAM4 Test Solution

  • 512 Gbit/s max. transmission capacity
  • PAM4 PPG/ED (MU196020A/MU196040A)
  • Baud rate of 2.4 to 64.2 Gbaud*1
  • Multichannel Scalability 4ch PAM4/NRZ  NEW
  • High-speed Tr/Tf of 8.5 ps (20 to 80%)
  • Low Intrinsic Jitter output of random Jitter 170 fs rms (typ.)
  • Low noise and low distortion high-quality data output
  • 4Tap Emphasis (20-dB Range)
  • ISI adjustment function  NEW
  • FEC pattern generation  NEW
  • Stressed margin BER < E-12*2
  • Built-in Clock Recovery
  • PAM4 pattern editor and symbol error measurement
  • Jitter Addition, Jitter Tolerance measurement functions (SJ/RJ/BUJ/SSC)
  • Voltage Noise Addition function (Common/Differential/White Noise)
  • Jitter Tolerance measurement using DUT BER counter function  NEW

1: Future support for ED (Over 32.1G)

2: At PAM4 Stressed waveform input refer to CEI

HighSpeed Serial BUS Test Solution (PCI Express, USB, Thunderbolt)

  • 512 Gbit/s max. transmission capacity, one main frame expandable to 16ch (filling 8 slots with 32 Gbit/s 2 ch PPG)
  • All-in-one support for both high-speed Ethernet and PCI Express interface tests
  • New wideband 32 Gbit/s SI PPG/ED (MU195020A/MU195040A)
    • Bit rate of 2.4 Gbit/s to 32.1 Gbit/s
    • NRZ/PAM4 Support
    • 10Tap Emphasis
    • Variable ISI function
    • Multi-band CTLE (8 Gbit/s, 16 Gbit/s, 28 Gbit/s bandwidths)
    • Low Intrinsic Jitter output of random Jitter 115 fs rms (typ.)
    • High-sensitivity Data input of 15 mV typ. (EYE Height)
    • 1ch/2ch Selection
  • PCI Express Link Training, LTSSM analysis (using MU195020A/MU195040A/MX183000A-PL021)
  • USB Express Link Training, LTSSM analysis (using MU195020A/MU195040A/MX183000A-PL022)
  • Jitter Addition, Jitter Tolerance measurement functions (SJ/RJ/BUJ/SSC, using MU181500B/MX183000A-PL001)
  • Voltage Noise Addition function (Common/Differential/White Noise, using MU195020A/MU195050A)

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