Key Features
  • Capabilities of analyzers, curve tracers, and I-V systems at a fraction of their cost
  • Five-inch, high resolution capacitive touchscreen GUI
  • 0.012% basic measure accuracy with 6½-digit resolution
  • Enhanced sensitivity with new 20mV and 10nA source/measure ranges
  • Source and sink (four-quadrant) operation
  • Four “Quickset” modes for fast setup and measurements
  • Built-in, context-sensitive front panel help
  • Front panel input banana jacks; rear panel input triaxial connections
  • 2450 SCPI and TSP® scripting programming modes
  • 2400 SCPI-compatible programming mode
  • Front panel USB memory port for storing data, programming, instrument configurations, and to upgrade the unit 2450 main

 

Typical Applications
     Ideal for current/voltage characterization and functional test of a wide range of today’s modern electronics and devices, including:

  • Nanomaterials and Devices
    •  Graphene
    •  Carbon nanotubes
    •  Nanowires
    •  Low power nanostructures
  • Semiconductor Structures
    •  Wafers
    •  Thin films
  • Organic Materials and Devices
    •  E-inks
    •  Printable electronics
  • Energy Efficiency and Lighting
    •  LEDs/AMOLEDs
    •  Photovoltaics/Solar cells
    •  Batteries
  • Discrete and Passive Components
    •  Two-leaded: Resistors, diodes, zener diodes, LEDs, disk drive heads, sensors
    •  Three-leaded: Small signal bipolar junction transistors (BJTs), field effect transistors (FETs), and more
  • Material Characterization
    •  Resistivity
    •  Hall Effect
    •  High ohmic resistance (using triax connectors)
  • Electrochemistry
    •  Cyclic voltammetry
    •  Battery charge/discharge cycling
    •  Electro-deposition

 

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