Key Features
  • Four-channel SMU instrument in a single 1U full rack chassis
  • Stackable; no 1U spacing requirements between units
  • Tightly-integrated voltage/current source and measure instruments offer best in class performance with 6½-digit resolution
  • 20 V @ 1 A and 6 V @ 3 A power envelopes, 20 watts
  • 0.015% DCV basic accuracy
  • Up to 28 open drain digital I/O bits
  • Correlated results to the 2602B System SourceMeter SMU Instrument
  • TSP technology embeds complete test programs inside the instrument for best-in-class system-level throughput
  • TSP-Link expansion technology for multi-channel parallel test without a mainframe
  • Front Panel LAN (LXI-C), USB 2.0 TMC488 protocol, and digital I/O interfaces
  • Built-in web browser based software enables remote control through any browser, on any computer from anywhere in the world

 

Typical Applications
I-V functional test and characterization of a wide range of devices, including:

  • Optoelectronic devices
    •  Vertical cavity surface emitting lasers (VCSELs), laser diodes (used on 3D sensing systems)
    •  High brightness (HBLEDs), lightemitting diodes (LEDs)
    •  Displays
  • Integrated devices small scale integrated (SSI) and large scale integrated (LSI)
    •  Analog ICs
    •  Radio frequency integrated circuits (RFICs)
    •  Application specific integrated circuits (ASICs)
    •  System on a chip (SOC) devices
  • Discrete and passive components
    •  Two-leaded sensors, disk drive heads, metal oxide varistors (MOVs), diodes, zener diodes, sensors, capacitors, thermistors
    •  Three-leaded small signal bipolar junction transistors (BJTs), fieldeffect transistors (FETs), and more
  • Simple ICs optos, drivers, switches, sensors, converters, regulators

 

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