Key Features
  • Wide coverage up to 1100 V / 1 A DC 20 W max.
  • 10 fA measure resolution
  • 0.012% basic measure accuracy with 6½-digit resolution
  • Five-inch, high resolution capacitive touch screen GUI
  • Source and sink (4-quadrant) operation
  • SCPI and TSP® scripting programming modes
  • TSP-Link for multi-channel I-V testing
  • Front panel input banana jacks; rear panel high-voltage input triaxial connections
  • Built-in context-sensitive help
  • Front-panel USB 2.0 memory I/O port for transferring data, test scripts, and test configurations

 

Typical Applications
      Ideal for current/voltage characterization and functional test of a wide range of today’s modern electronics and devices, including:

  • Devices
    •  Power semiconductors and materials: SiC, GaN, power MOSFETs, power diodes
    •  IGBT
    •  Thyristors, SCRs
    •  Transient suppression devices
    •  Circuit protection devices: TVS, MOVs, fuses, etc.
    •  Connectors, switches, relays
    •  Power management modules
    •  Batteries
  • Tests
    •  I-V characterization
    •  Forward voltage
    •  Breakdown voltage
    •  Leakage current
    •  Isolation
    •  Hi-Pot
    •  Dielectric withstanding

 

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