Key Features
  • Wide dynamic range and high-speed measurement at optical receiver bandwidths used commonly by customers within production lines for optical active devices
    • SMSR measurement at 45 dB minimum
    • Maximum measurement processing time of 0.35s (sweeping 30-nm wavelength)
  • Facilitates Stable Production of High-output LDs
    • ±1.4 dB SMSR reproducibility
  • Same key functions and performance as predecessor, supporting various production-line environments
    • Wide wavelength band (600 nm to 1750 nm) for evaluating all optical active devices
    • Nine application menus for LD-module, WDM, etc., measurements

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