Keithley 2601B-PULSE System SourceMeter® Pulser/SMU Instrument

The new 2601B-PULSE System SourceMeter 10 μs Pulser/SMU Instrument with PulseMeter™ technology is an industry-leading high current/high speed pulser with measure plus the full functionality of a traditional SMU. This new pulser offers leading 10 A current pulse output at 10 V with a pulse width minimum of 10 μs, perfect for testing vertical cavity surface emitting lasers (VCSEL) used in LIDAR and facial recognition, LEDs for lighting and displays, semiconductor device characterization, surge protection testing, and so much more. The pulser’s built-in dual 1 Megasample/second (MS/s), 18-bit digitizers make it possible to acquire both pulse current and voltage waveforms simultaneously without the need to use a separate instrument. The 2601B-PULSE is a powerful solution that significantly boosts productivity in applications ranging from benchtop characterization

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Key Features
  • Industry leading 10 A @ 10 V, 10 microsecond pulse output
  • No tuning required; works with inductive loads up to 3 μH
  • Dual 1 Mega sample/second digitizers for high speed I/V pulse measurements (pulser function only)
  • DC capability up to ±40 V @ ±1.0 A, 40 Watt
  • TSP technology embeds complete test programs inside the instrument for best-in-class system-level throughput
  • TSP-Link expansion technology for multi-channel parallel test without a mainframe
  • USB 2.0, LXI Core, GPIB, RS-232, and digital I/O interfaces
  • Supported in the Keithley KickStart non-programming software tool

 

Typical Applications
I-V functional test and characterization of a wide range of devices, including:

  • Optoelectronic devices such as vertical cavity surface emitting lasers (VCSELs), laser diodes, light emitting diodes (LEDs), high brightness LEDs (HBLEDs), displays
  • Discrete and passive components including sensors, disk drive heads, metal oxide varistors (MOVs), diodes, Zener diodes, sensors, capacitors, thermistors
  • Simple ICs – Optos, drivers, switches, sensors, converters, regulators
  • Integrated devices – small scale integrated (SSI) and large scale integrated (LSI)
    •  Analog ICs
    •  Radio frequency integrated circuits (RFICs)
    •  Application specific integrated circuits (ASICs)
    •  System on a chip (SOC) devices
  • Wafer level reliability
    •  NBTI, TDDB, HCI, electromigration
  • Batteries
  • Failure Analysis
  • And more…

 

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